At next month’s PCIM Europe, PEM (Power Electronic Measurements) will launch its next-generation CWT current probes for high-speed and high power-density applications. Clip-on Rogowski current probes provide a convenient means of measuring alternating currents. The company’s latest wideband probes use a shielding technique to eliminate the effects of high field strengths in today’s high power-density and high-speed circuits. Pictured here is a CWT shielded mini coil, threaded through the legs of a TO247 semiconductor package. Visitors to the company’s stand (Hall 7 – 152) will also be able to see the company’s full range of Rogowski waveform transducers, probes and industrial sensors, which includes the CWT and RCT ranges. The company’s managing director, Dr Chris Hewson, will also introduce the new probes during his presentation on ‘Next Generation Rogowski Current Probes’ on Tuesday, 20th May 4.00 – 4.20pm.

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