Among them is the CWT MiniHF. This AC probe not only provides better common mode immunity to local high voltage transients, but also provides a more precise measurement delay, says the company, compensation of which improves power loss measurement in power semiconductors using SiC and GaN technology.

The wide-band screened probe’s shielding technique uses a low sensitivity coil and patented low-noise signal-conditioning circuitry. It boosts immunity to local dV/dt transients while maintaining a small size , flexibility, and 3dB bandwidth of up to 30MHz for a 100mm coil. The probes feature a coil just 4.5mm thick with 5kV insulation voltage, and can handle maximum current slope of 100kA/µs.

PEM’s director of engineering, Joanne Aberdeen, will also be delivering a vendor presentation on Wednesday 20, May 2015 at 2:40 pm on ‘The Practicalities of Measuring Fast Switching/Transient Currents in Power Electronic Applications Using Rogowski Transducers’.